Transistor Sizing for Reliable Domino Logic Design in Dual Threshold Voltage Technologies

TitleTransistor Sizing for Reliable Domino Logic Design in Dual Threshold Voltage Technologies
Publication TypeConference Paper
Year of Publication2001
AuthorsJung, S  O, Kim, K  W, Kang, S-M
Conference NameACM 11th Great Lakes Symposium on VLSI
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