Submitted by skang on Mon, 09/26/2011 - 11:40
| Title | 2-Level LFSR scheme with Asynchronous Test Pattern Transfer for Low Cost and High Efficiency Built-In-Self-Test |
| Publication Type | Conference Paper |
| Year of Publication | 2001 |
| Authors | Yoo, S M, Jung, S O, Kang, S-M |
| Conference Name | ACM 11th Great Lakes Symposium on VLSI |
| Full Text | |